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ILNAS-EN IEC 62433-6:2020 Edition 11/2020
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
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Abstract

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML.

Status

Standard - Active

Origin

Technical Committee :
CLC/SR 47A : Integrated circuits

Implementation

start of the vote on the project    24/01/2020   date of ratification (dor)    27/10/2020
end of the vote on the project    17/04/2020   date of anouncement (doa)    27/01/2021
start of the vote on the final project    05/04/2021   date of publication (dop)    27/07/2021
end of the vote on the final project    17/05/2021   date of withdrawal (dow)    27/10/2023


Publication Official Journal
of the Grand-Duchy of Luxembourg
25/05/2021
Reference Mémorial A N° 394

Relations

Relations to international standards
IEC 62433-6:201X 
IEC 62433-6:2020 

International Classification for Standards (ICS codes) :

31.200 : Integrated circuits. Microelectronics

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