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IEC 62899-503-3 Ed.1.0 Edition
Printed electronics- Part 503-3 : Quality assessment - Measuring method of contact resistance for the printed thin film transistor by transfer length method
At present no electronic version for this standard online.
Please feel free to contact normalisation@ilnas.etat.lu
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Status

Draft - Active
If you have any comments on this standard in public inquiry, you can submit them by filling out the commenting form .

Origin

Technical Committee :
119 : Printed electronics

Implementation

start of the vote on the project    21/02/2020   date of ratification (dor)   
end of the vote on the project    21/04/2020   date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
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