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ILNAS-EN IEC 61967-8:2023 Edition 06/2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
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Abstract

IEC 61967-8:2023 is available as IEC 61967-8:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 3 GHz was deleted from the scope; b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

Status

Standard - Active

Origin

Technical Committee :
CLC/SR 47A : Integrated circuits

Implementation

start of the vote on the project    29/07/2022   date of ratification (dor)    07/06/2023
end of the vote on the project    21/10/2022   date of anouncement (doa)    07/09/2023
start of the vote on the final project    24/02/2023   date of publication (dop)    07/03/2024
end of the vote on the final project    07/04/2023   date of withdrawal (dow)    07/06/2026


Publication Official Journal
of the Grand-Duchy of Luxembourg
19/12/2023
Reference Mémorial A N° 808

Relations

Relations to international standards
IEC 61967-8:2023 
IEC 61967-8 ED2 

International Classification for Standards (ICS codes) :

31.200 : Integrated circuits. Microelectronics

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