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ILNAS-EN 61967-1:2002 Edition 06/2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 1: General conditions and definitions
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Abstract

Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

Status

Standard - Superseded

Origin

Technical Committee :
CLC/SR 47A : Integrated circuits

Implementation

start of the vote on the project    04/06/2001   date of ratification (dor)   
end of the vote on the project    04/08/2001   date of anouncement (doa)    01/08/2002
start of the vote on the final project    14/12/2001   date of publication (dop)    01/02/2003
end of the vote on the final project    14/02/2002   date of withdrawal (dow)    01/05/2005


Publication Official Journal
of the Grand-Duchy of Luxembourg
27/08/2002
Reference

Relations

Evolutions
ILNAS-EN IEC 61967-1:2019

Relations to international standards
IEC 61967-1:2002 (EQV) 

International Classification for Standards (ICS codes) :

31.200 : Integrated circuits. Microelectronics

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