magnifying icon Basket
1 item ^

Basket is empty
Login

Login

LOGGED AS

Help

Satisfaction enquiry

SATISFACTION ENQUIRY

Newsletter

Free of charge lifelong learning "Standardization"

FREE OF CHARGE LIFELONG LEARNING "STANDARDIZATION"

Standardisation

Draft standards in public enquiry

DRAFT STANDARDS IN PUBLIC ENQUIRY

Standards organizations

STANDARDS ORGANIZATIONS

  • National standards

  • European standards

  • International standards


Deliverable

 
Free preview
Price
Language
 
IEC 60747-5-3 Ed. 1.0 Edition 09/1997
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
  •   
  •  
  • 207.5 / copy
  •  
 

Abstract

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Status

Standard - Withdrawn

Origin

Technical Committee :
47E : Discrete semiconductor devices

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60747-5-6 Ed. 1.0
IEC 60947-2 Ed. 4.2
IEC 60947-2 Ed. 4.2
IEC 60747-5-7 Ed. 1.0
IEC 60947-2 Ed. 4.2

International Classification for Standards (ICS codes) :

31.260 : Optoelectronics. Laser equipment

magnifying icon Basket
1 item ^

Basket is empty


Warning:
DIN standards can be downloaded only once! After downloading, they are no longer available in the eLibrary.
Begin download?