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IEC/PAS 62175 Ed. 1.0 Edition 08/2000
Marking permanency test method
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  • 18.2 / copy
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Abstract

Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.

Status

Standard - Superseded

Origin

Technical Committee :
47 : Semiconductor devices

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60749-9 Ed. 1.0

International Classification for Standards (ICS codes) :

31.080.01 : Semiconductor devices in general

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