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IEC/PAS 62396-2 Ed. 1.0 Edition 09/2007
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
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  • 145.5 / copy
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Abstract

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Status

Standard - Superseded

Origin

Technical Committee :
107 : Process management for avionics

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60951-3 Ed.3.0 RLV
IEC/TS 62396-2 Ed. 1.0

International Classification for Standards (ICS codes) :

03.100.50 : Production. Production management
31.020 : Electronic components in general
49.060 : Aerospace electric equipment and systems

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