magnifying icon Basket
1 item ^

Basket is empty
Login

Login

LOGGED AS

Help

Satisfaction enquiry

SATISFACTION ENQUIRY

Newsletter

Free of charge lifelong learning "Standardization"

FREE OF CHARGE LIFELONG LEARNING "STANDARDIZATION"

Standardisation

Draft standards in public enquiry

DRAFT STANDARDS IN PUBLIC ENQUIRY

Standards organizations

STANDARDS ORGANIZATIONS

  • National standards

  • European standards

  • International standards


Deliverable

 
Free preview
Price
Language
 
ILNAS-EN 60749-5:2003 Edition 03/2003
Semiconductor devices - Mechanical and climatic test methods -- Part 5: Steady-state temperature humidity bias life test
  •   
  •   
  •  
  • 17.8 / copy
  •  
 

Abstract

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Status

Standard - Superseded

Origin

Technical Committee :
CLC/SR 47 : Semiconductor devices

Implementation

start of the vote on the project    28/04/2003   date of ratification (dor)   
end of the vote on the project    28/06/2003   date of anouncement (doa)    01/06/2003
start of the vote on the final project    11/10/2002   date of publication (dop)    01/12/2003
end of the vote on the final project    11/12/2002   date of withdrawal (dow)    01/03/2006


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
ILNAS-EN 60749-5:2017

Relations to international standards
IEC 60749-5:2003 (EQV) 

International Classification for Standards (ICS codes) :

31.080.01 : Semiconductor devices in general

magnifying icon Basket
1 item ^

Basket is empty


Warning:
DIN standards can be downloaded only once! After downloading, they are no longer available in the eLibrary.
Begin download?