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ILNAS-EN 60749-5:2017 Edition 07/2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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Abstract

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a)   correction of an error in an equation; b)   inclusion of notes for guidance; c)   clarification of the applicability of test conditions.

Status

Standard - Active

Origin

Technical Committee :
CLC/SR 47 : Semiconductor devices

Implementation

start of the vote on the project    02/09/2016   date of ratification (dor)    15/05/2017
end of the vote on the project    25/11/2016   date of anouncement (doa)    15/08/2017
start of the vote on the final project    03/02/2017   date of publication (dop)    15/02/2018
end of the vote on the final project    17/03/2017   date of withdrawal (dow)    15/05/2020


Publication Official Journal
of the Grand-Duchy of Luxembourg
01/02/2018
Reference Mémorial A N° 106

Relations

Evolutions
ILNAS-EN IEC 60749-5:2024

Relations to older standards
ILNAS-EN 60749-5:2003

Relations to international standards
IEC 60749-5:201X (47/2367/FDIS) (EQV) 
IEC 60749-5:201X (47/2311/CDV) (EQV) 
IEC 60749-5:2017 (EQV) 

International Classification for Standards (ICS codes) :

31.080.01 : Semiconductor devices in general

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