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IEC 60749-8 Ed. 1.0 Edition 08/2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
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  • 70.6 / copy
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Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.

Status

Standard - Active

Origin

Technical Committee :
47 : Semiconductor devices

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Relations to older standards
IEC 60749 Ed. 2.0

International Classification for Standards (ICS codes) :

31.080.01 : Semiconductor devices in general

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