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IEC 62276 Ed. 1.0 Edition 05/2005
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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  • 236.5 / copy
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Abstract

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Status

Standard - Superseded

Origin

Technical Committee :
49 : Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60951-3 Ed.3.0 RLV

Relations to older standards
IEC/PAS 62276 Ed. 1.0

International Classification for Standards (ICS codes) :

31.140 : Piezoelectric devices

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