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IEC 60747-5-4 Ed. 1.0 Edition 02/2006
Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
  •   
  •  
  • 191 / copy
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Abstract

Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.

Status

Standard - Active

Origin

Technical Committee :
47E : Discrete semiconductor devices

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60951-3 Ed.3.0 RLV
IEC 60747-5-4 Ed.2.0

Relations to older standards
IEC 60747-5-3 Ed. 1.0
IEC 60747-5-1 Ed. 1.0
IEC 60747-5-1 Ed. 1.2
IEC 60747-5-3 Ed. 1.1
IEC 60747-5-2 Ed. 1.0
IEC 60747-5-1 am2 Ed. 1.0
IEC 60747-5-3 am1 Ed. 1.0
IEC 60747-5-2 am1 Ed. 1.0

International Classification for Standards (ICS codes) :

31.080.01 : Semiconductor devices in general
31.260 : Optoelectronics. Laser equipment

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