Abstract
IEC 60904-7:2008 describes the procedure for correcting the bias error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum and by the mismatch between the spectral responses (SR) of the reference cell and of the test specimen. The procedure applies only to photovoltaic devices linear in SR as defined in IEC 60904-10. This procedure is valid for single junction devices but the principle may be extended to cover multijunction devices. This new edition includes the following changes with respect to the previous one: description of when it is necessary to use the method and when it may not be needed; addition of new clauses.
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