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IEC 61163-2 Ed. 1.0 Edition 11/1998
Reliability stress screening - Part 2: Electronic components
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  • 236.5 / copy
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Abstract

Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.

Status

Standard - Active

Origin

Technical Committee :
56 : Dependability

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60951-3 Ed.3.0 RLV
IEC 61163-2 Ed.2.0

Relations to older standards
IEC 60300-3-7 Ed. 1.0

International Classification for Standards (ICS codes) :

03.120.01 : Quality in general
31.020 : Electronic components in general

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