IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
Standard - Actif |
Comité technique : |
119 : Printed electronics |
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Publication au Journal officiel
du Grand-Duché de Luxembourg |
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Référence |
31.180 : Printed circuits and boards |