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ILNAS-EN IEC 61967-1:2019 Edition 02/2019
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
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Abstract

This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967.

Status

Standard - Active

Origin

Technical Committee :
CLC/SR 47A : Integrated circuits

Implementation

start of the vote on the project    05/01/2018   date of ratification (dor)    16/01/2019
end of the vote on the project    23/03/2018   date of anouncement (doa)    16/04/2019
start of the vote on the final project    14/09/2018   date of publication (dop)    16/10/2019
end of the vote on the final project    26/10/2018   date of withdrawal (dow)    16/01/2022


Publication Official Journal
of the Grand-Duchy of Luxembourg
21/03/2019
Reference Mémorial A N° 170

Relations

Relations to older standards
ILNAS-EN 61967-1:2002

Relations to international standards
IEC 61967-1:201X 
IEC 61967-1:2018 

International Classification for Standards (ICS codes) :

31.200 : Integrated circuits. Microelectronics

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