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IEC 61967-8 Ed. 1.0 Edition 08/2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
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Abstract

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

This publication is to be read in conjunction with IEC 61967-1:2002.

Status

Standard - Active

Origin

Technical Committee :
47A : Integrated circuits

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60951-3 Ed.3.0 RLV
IEC 61967-8 Ed.2.0

International Classification for Standards (ICS codes) :

31.200 : Integrated circuits. Microelectronics

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