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IEC/PAS 62180 Ed. 1.0 Edition 08/2000
Electrostatic discharge (ESD) sensitivity testing machine model (MM)
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Abstract

Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.

Status

Standard - Superseded

Origin

Technical Committee :
47 : Semiconductor devices

Implementation

start of the vote on the project      date of ratification (dor)   
end of the vote on the project      date of anouncement (doa)   
start of the vote on the final project      date of publication (dop)   
end of the vote on the final project      date of withdrawal (dow)   


Publication Official Journal
of the Grand-Duchy of Luxembourg
Reference

Relations

Evolutions
IEC 60749-27 Ed. 1.0

International Classification for Standards (ICS codes) :

31.080.01 : Semiconductor devices in general

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